Solution deposition of chalcogenide films

ABSTRACT

A method of depositing a film of a metal chalcogenide. The first of these methods includes the steps of: contacting at least one metal chalcogenide, a hydrazine compound and optionally, an elemental chalcogen, to produce a solution of a hydrazinium-based precursor of the metal chalcogenide; applying the solution of the hydrazinium-based precursor of the metal chalcogenide onto a substrate to produce a film of the precursor; and thereafter annealing the film of the precursor to remove excess hydrazine and hydrazinium chalcogenide salts to produce a metal chalcogenide film on the substrate. The second of these methods includes the steps of: contacting: at least one metal chalcogenide and a salt of an amine compound to produce an ammonium-based precursor of the metal chalcogenide; contacting the ammonium-based precursor of the metal chalcogenide and a hydrazine compound, and optionally, an elemental chalcogen, to produce a solution of a hydrazinium-based precursor of the metal chalcogenide in the hydrazine compound; applying the solution of the hydrazinium-based precursor onto a substrate to produce a film; and thereafter, annealing to produce a metal chalcogenide film. Also provided is a thin-film field-effect transistor device using the metal chalcogenides as the channel layer.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to methods of depositing a film of a metal chalcogenide and a method of preparing an improved field-effect transistor including film of a metal chalcogenide. More particularly, the present invention relates to a method of preparing an improved field-effect transistor including a film of a metal chalcogenide as the channel layer.

2. Description of the Prior Art

The ability to deposit high quality semiconducting, metallic and insulating thin films forms one of the important pillars of present-day solid-state electronics. A solar cell may include, for example, a thin n-type semiconductor layer (˜0.25 μm) deposited on a p-type substrate, with electrical contacts attached to each layer to collect the photocurrent. Light-emitting diodes (LED's) are typically comprised of a p-n bilayer, which under proper forward bias conditions emits light.

Thin-film field-effect transistors, denoted here as TFT's, include thin p- or n-type semiconducting channel layers, in which the conductivity is modulated by application of a bias voltage to a conducting gate layer that is separated from the channel by a thin insulating barrier. The electronic materials that comprise modern semiconducting devices have typically been silicon based, but can equally be considered from other families of materials, in some cases potentially offering advantages over the silicon-based technologies. The current invention relates to a new method of solution-depositing chalcogenide-based electronic materials in the form of high-quality thin films for application in electronic devices. Ability to deposit from solution is particularly attractive since it opens the opportunity to employ a number of low-cost, low-temperature, relatively quick techniques such as spin-coating, printing, stamping, and dipping. While the discussion presented below primarily refers to the application of these films in TFT's, this discussion is meant to be representative, and the electronic films so deposited could equally be used in other electronic devices as well.

Thin-film field-effect transistors (TFT's), are widely used as switching elements in electronic applications, most notably for logic and driver circuitry within processor and display applications. Presently, TFT's for many lower-end applications, including those employed in active matrix liquid crystal displays, are made using amorphous silicon as the semiconductor. Amorphous silicon provides a cheaper alternative to crystalline silicon—a necessary condition for reducing the cost of transistors for large area applications. Application of amorphous silicon is limited, however, to slower speed devices, since the mobility (˜10⁻¹ cm²N-sec) is approximately 15,000 times smaller than that of crystalline silicon.

In addition, although amorphous silicon is cheaper to deposit than crystalline silicon, deposition of amorphous silicon still requires costly processes such as plasma enhanced chemical vapor deposition. The search for alternative semiconductors (i.e., not silicon), for use in TFT's and other electronic devices is therefore being vigorously pursued.

If a semiconducting material could be identified which simultaneously provides higher mobility and low-cost processing at moderate/low temperatures, many new applications can be envisioned for these materials, including light, flexible, very large-area displays or electronics constructed entirely on plastic.

Recently, organic semiconductors have received considerable attention as potential replacements for inorganic counterparts in TFT's (see, for example, U.S. Pat. No. 5,347,144 assigned to Garnier et.al., entitled “Thin-Layer Field Effect Transistor With MIS Structure Whose Insulator and Semiconductor Are Made of Organic Materials”) and LED's [S. E. Shaheen et al., “Organic Light-Emitting Diode with 20 Im/W Efficiency Using a Triphenyldiamine Side-Group Polymer as the Hole Transport Layer,” Appl. Phys. Lett. 74, 3212 (1999)].

Organic materials have the advantage of simple and low-temperature thin-film processing through inexpensive techniques such as spin coating, ink jet printing, thermal evaporation, or stamping. Over the last few years, the carrier mobilities of the organic channel layers in OTFTs (organic TFTs) have increased dramatically from <10⁻⁴ to ˜1 cm²N-sec (comparable to amorphous silicon) [see, for example, C. D. Dimitrakopoulos and D. J. Mascaro, “Organic thin-film transistors: A review of recent advances,” IBM J. Res. & Dev. 45, 11-27 (2001)].

While very promising with regard to processing, cost, and weight considerations, organic compounds generally have a number of disadvantages, including poor thermal and mechanical stability. In addition, while the electrical transport in organic materials has improved substantially over the last 15 years, the mobility is fundamentally limited by the weak van der Waals interactions between organic molecules (as opposed to the stronger covalent and ionic forces found in extended inorganic systems).

The inherent upper bound on electrical mobility translates to a cap on switching speeds and therefore on the types of applications that might employ the low-cost organic devices. Organic semiconductors are therefore primarily being considered for lower-end applications.

One approach to improving mobility/durability involves combining the processibility of organic materials with the desireable electrical transport and thermal/mechanical properties of inorganic semiconductors within hybrid systems [D. B. Mitzi et al., “Organic-Inorganic Electronics,” IBM J. Res. & Dev. 45, 29-45 (2001)]. Organic-inorganic hybrid films have recently been employed as the semiconductive element in electronic devices, including TFTs (see, for example, U.S. Pat. No. 6,180,956, assigned to Chondroudis et al., entitled “Thin-Film Transistors with Organic-Inorganic Hybrid Materials as Semiconducting Channels”) and LEDs (see, for example, U.S. Pat. No. 6,420,056, assigned to Chondroudis et al., entitled “Electroluminescent Device With Dye-Containing Organic-inorganic Hybrid Materials as an Emitting Layer”).

Several simple techniques have been described for depositing crystalline organic-inorganic hybrid films, including multiple-source thermal evaporation, single source thermal ablation, and melt processing.

Solution-deposition techniques (e.g., spin coating, stamping, printing) have also received recent attention and are particularly attractive since they enable the quick and inexpensive deposition of the hybrids on a diverse array of substrates. TFT's based on a spin-coated semiconducting tin(II)-iodide-based hybrid have yielded mobilities as high as 1 cm²N-sec (similar to the best organic-based devices prepared using vapor-phase deposition and amorphous silicon).

Melt-processing of the hybrid systems has improved the grain structure of the semiconducting films, thereby leading to higher mobilities of 2-3 cm²N-sec [D. B. Mitzi et.al., “Hybrid Field-Effect Transistors Based on a Low-Temperature Melt-Processed Channel Layer,” Adv. Mater. 14, 1772-1776 (2002)].

While very promising, current examples of hybrid semiconductors are based on an extended metal halide frameworks (e.g., metal chlorides, metal bromides, metal iodides, most commonly tin(II) iodide). Metal halides are relatively ionic in nature, thereby limiting the selection of possible semiconducting systems with potential for high mobility. In addition, the tin(II)-iodide-based systems in particular are highly air sensitive and all processing must by done under inert-amosphere conditions. Furthermore, while the tin(II)-iodide-based systems are p-type semiconductors, it is also desireable to find examples of n-type systems, to enable applications facilitated by complementary logic. So far none have been identified.

Another alternative to silicon-based, organic, and metal-halide-based hybrid semiconductors involves the use of metal chalcogenides (e.g., metal sulfides, metal selenides, metal tellurides) as semiconductive elements for use within TFT's and other electronic devices. Some of the earliest solar cells [D.C. Raynolds et al. “Photovoltaic Effect in Cadmium Sulfide,” Phy. Rev. 96, 533 (1954)] and TFTs [P. K. Weimer, “The TFT—A New Thin-Film Transistor,” Proc. IRE 50, 1462-1469 (1964)] were in fact based on metal chalcogenide active layers. There are numerous examples of metal chalcogenide systems that are potentially useful as semiconductive materials. Tin(IV) sulfide, SnS₂, is one candidate that has generated substantial interest as a semiconducting material for solar cells, with n-type conductivity, an optical band gap of ˜2.1 eV and a reported mobility of 18 cm²N-sec [G. Domingo et al., “Fundamental Optical Absorption in SnS₂ and SnSe₂,” Phys. Rev. 143, 536-541 (1966)].

These systems might be expected to yield higher mobility than the organic and metal-halide-based hybrids, as a result of the more covalent nature of the chalcogenides, and also provide additional opportunities for identifying n-type semiconductors.

Reported mobilities of metal chalcogenides, for example, include SnSe₂ (27 cm²N-sec/n-type) [G. Domingo et al., “Fundamental Optical Absorption in SnS₂ and SnSe₂,” Phys. Rev. 143, 536-541 (1966)], SnS₂ (18 cm²N-sec/n-type) [T. Shibata et al., “Electrical Characterization of 2H-SnS₂ Single Crystals Synthesized by the Low Temperature Chemical Vapor Transport Method,” J. Phys. Chem. Solids 52, 551-553 (1991)], CdS (340 cm²N-sec/n-type), CdSe (800 cm²N-sec/n-type) [S. M. Sze, “Physics of Semiconductor Devices,” John Wiley & Sons, New York, 1981, p. 849], ZnSe (600 cm²N-sec/n-type), and ZnTe (100 cm²N-sec/p-type) [B. G. Streetman, “Solid State Electronic Devices,” Prentice-Hall, Inc., New Jersey, 1980, p. 443].

While the potential for higher mobility exists, the increased covalency of the extended metal chalcogenide systems also reduces their solubility and increases the melting temperature, rendering simple and low-cost thin-film deposition techniques for these systems a significant challenge.

A number of techniques have been proposed and employed for the deposition of chalcogenide-based films, including thermal evaporation [A. Van Calster et.al., “Polycrystalline cadmium selenide films for thin film transistors,” J. Crystal Growth 86, 924-928 (1988)], chemical vapor deposition (CVD) [L. S. Price et al., “Atmospheric Pressure CVD of SnS and SnS₂ on Glass,” Adv. Mater. 10, 222-225 (1998)], galvanic deposition [B. E. McCandless et al., “Galvanic Deposition of Cadmium Sulfide Thin Films,” Solar Energy Materials and Solar Cells 36, 369-379 (1995)], chemical bath deposition [F. Y. Gan et al., “Preparation of Thin-Film Transistors With Chemical Bath Deposited CdSe and CdS Thin Films,” IEEE Transactions on Electron Devices 49, 15-18 (2002)], and successive ionic layer adsorption and reaction (SILAR) [B. R. Sankapal et al., “Successive ionic layer adsorption and reaction (SILAR) method for the deposition of large area (˜10 cm²) tin disulfide (SnS₂) thin films,” Mater. Res. Bull. 35, 2027-2035 (2001)].

However, these techniques are generally not amenable to low-cost, high-thoughput (fast) solution-based deposition techniques such as spin-coating, printing and stamping. What is required for application of these techniques is a truly soluble precursor for the chalcogenide and a suitable solvent. Given the potential for high electrical mobility in the metal chalcogenide systems and both n- and p-channel devices, if a convenient and rapid solution-based technique could be identified for their deposition, the field of low-cost solution-based electronics, currently primarily being pursued within the context of organic electronics, might be extended to higher-end applications, such as logic circuitry and very large area displays.

Spray pyrolysis is one technique employing the rapid decomposition of a soluble precursor [M. Krunks et al., “Composition of CuInS₂ thin films prepared by spray pyrolysis,” Thin Solid Films 403-404, 71-75 (2002)]. The technique involves spraying a solution, which contains the chloride salts of the metal along with a source of the chalcogen (e.g., SC(NH₂)₂), onto a heated substrate (generally in the range 250-450° C.).

While metal chalcogenide films are formed using this technique, the films generally have substantial impurities of halogen, carbon or nitrogen. Annealing in reducing atmospheres of H₂ or H₂S at temperatures up to 450° C. can be used to reduce the level of impurities in the film, but these relatively aggressive treatments are not compatible with a wide range of substrate materials and/or require specialized equipment.

Ridley et al. [B. A. Ridley et al., “All-Inorganic Field Effect Transistors Frabricated by Printing,” Science 286, 746-749 (1999)] describes CdSe semiconducting films that are printed using a soluble metal chalcogenide precursor formed using organic derivatized CdSe nanocrystals. This technique, however, requires the formation of nanocrystals with tight control on particle size distribution in order to enable effective sintering during a postdeposition thermal treatment. The particle size control requires repeated dissolution and centrifugation steps in order to isolate a suitably uniform collection of nanocrystals.

Further, reported TFT devices prepared using this technique exhibited unusual features, including substantial device hysteresis and a negative resistance in the saturation regime, perhaps as a result of trap or interface states either within the semiconducting film or at the interface between the semiconductor and the insulator.

Dhingra et al. [S. Dhingra et al., “The use of soluble metal-polyselenide complexes as precursors to binary and ternary solid metal selenides,” Mat. Res. Soc. Symp. Proc. 180, 825-830 (1990)] have also demonstrated a soluble precursor for metal chalcogenides that can be used to spin coat films of the corresponding metal chalcogenide (after thermal treatment to decompose the precursor).

However, in this process, the species used to solublize the chalcogenide framework (i.e., quaternary ammonium or phosphonium polyselenides), which ultimately decompose from the sample during the heat treatment, are very bulky and most of the film disappears during the annealing sequence (e.g., 70-87%). The resulting films consequently exhibit inferior connectivity and quality. The large percentage of the sample that is lost during the thermal treatment implies that only relatively thick films can be deposited using this technique, since thin films would be rendered discontinuous (the above mentioned study considered films with thickness ˜25-35 μm). Additionally, relatively high temperatures are required for the thermal decomposition of the polyselenides (˜530° C.), making this process incompatible with even the most thermally robust plastic substrates (e.g., Kapton sheet can withstand temperatures as high as 400° C.).

A study has also concluded that films of crystalline MoS₂ can be spin coated from a solution of (NH₄)₂MOS₄ in an organic diamine [J. Pütz and M. A. Aegerter, “Spin-Coating of MoS₂ Thin Films,” Proc. of International Congress on Glass, vol. 18, San Francisco, Calif., Jul. 5-10, 1998, 1675-1680]. However, high-temperature post-deposition anneals are required to achieve crystalline films (600-800° C.), rendering the process incompatible with organic-based flexible substrate materials.

A similar procedure has led to the formation of amorphous As₂S₃ and As₂Se₃ films [G. C. Chern and I. Lauks, “Spin-Coated Amorphous Chalcogenide Films,” J. Applied Phys. 53, 6979-6982 (1982)], but attempts to deposit other main-group metal chalcogenides, such as Sb₂S₃ and GeS_(x) have not been successful, due to the low solubility of the precursors in the diamine solvents [J. Pütz and M. A. Aegerter, “Spin-Coating of MoS₂ Thin Films,” Proc. of International Congress on Glass, vol. 18, San Francisco, Calif., Jul. 5-10, 1998, 1675-1680].

Improvement in the above-described solution-based processes are therefore required for practical applications, especially for the fabrication of crystalline films of main-group metal chalcogenides, such as those derived from Ge, Sn, Pb, Sb, Bi, Ga, In, TI, which can potentially provide high mobility in a semiconductor with reasonable band gap for a transistor.

SUMMARY OF THE INVENTION

The present invention provides a first method of depositing a film of a metal chalcogenide, including the steps of:

-   -   contacting: at least one metal chalcogenide; a hydrazine         compound represented by the formula:         R¹R²N—NR³R⁴         wherein each of R¹, R², R³ and R⁴ is independently hydrogen,         aryl, methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms; and optionally, an elemental chalcogen, such as,         S, Se, Te or a combination thereof; to produce a solution of a         hydrazinium-based precursor of the metal chalcogenide;     -   applying the solution of the hydrazinium-based precursor of the         metal chalcogenide onto a substrate to produce a film of the         precursor; and thereafter     -   annealing the film of the precursor to remove excess hydrazine         and hydrazinium chalcogenide salts to produce a metal         chalcogenide film on the substrate.

The present invention further provides a second method of depositing a film of a metal chalcogenide, including the steps of:

-   -   contacting: at least one metal chalcogenide and a salt of an         amine compound with H₂S, H₂Se or H₂Te, wherein said amine         compound is represented by the formula:         NR⁵R⁶R⁷         wherein each of R⁵, R⁶ and R⁷ is independently hydrogen, aryl,         methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms, to produce an ammonium-based precursor of the         metal chalcogenide;     -   contacting the ammonium-based precursor of the metal         chalcogenide, a hydrazine compound represented by the formula:         R¹R²N—NR³R⁴         wherein each of R¹, R², R³ and R⁴ is independently hydrogen,         aryl, methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms, and optionally, an elemental chalcogen, such as,         S, Se, Te or a combination thereof, to produce a solution of a         hydrazinium-based precursor of the metal chalcogenide in the         hydrazine compound;     -   applying the solution of the hydrazinium-based precursor of the         metal chalcogenide onto a substrate to produce a film of the         precursor; and thereafter     -   annealing the film of the precursor to remove excess hydrazine         and hydrazinium chalcogenide salts to produce a metal         chalcogenide film on the substrate.

The present invention still further provides a method of preparing an improved field-effect transistor of the type having a source region and a drain region, a channel layer extending between the source region and the drain region, the channel layer including a semiconducting material, a gate region disposed in spaced adjacency to the channel layer, an electrically insulating layer between the gate region and the source region, drain region and channel layer, wherein the improvement includes:

-   -   preparing a channel layer including a film of a metal         chalcogenide semiconducting material by a first or second         method;     -   wherein the first method includes the steps of:     -   contacting: at least one metal chalcogenide; a hydrazine         compound represented by the formula:         R¹R²N—NR³R⁴         wherein each of R¹, R², R³ and R⁴ is independently hydrogen,         aryl, methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms; and optionally, an elemental chalcogen, such as,         S, Se, Te or a combination thereof; to produce a solution of a         hydrazinium-based precursor of the metal chalcogenide;     -   applying the solution of the hydrazinium-based precursor of the         metal chalcogenide onto a substrate to produce a film of the         precursor; and thereafter     -   annealing the film of the precursor to remove excess hydrazine         and hydrazinium chalcogenide salts to produce a metal         chalcogenide film; and     -   wherein the second method includes the steps of:     -   contacting: at least one metal chalcogenide and a salt of an         amine compound with H₂S, H₂Se or H₂Te, wherein said amine         compound is represented by the formula:         NR⁵R⁶R⁷         wherein each of R⁵, R⁶ and R⁷ is independently hydrogen, aryl,         methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms, to produce an ammonium-based precursor of the         metal chalcogenide;     -   contacting the ammonium-based precursor of the metal         chalcogenide, a hydrazine compound represented by the formula:         R¹R²N—NR³R⁴         wherein each of R¹, R², R³ and R⁴ is independently hydrogen,         aryl, methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms, and optionally, an elemental chalcogen, such as,         S, Se, Te or a combination thereof, to produce a solution of a         hydrazinium-based precursor of the metal chalcogenide in the         hydrazine compound;     -   applying the solution of the hydrazinium-based precursor of the         metal chalcogenide onto a substrate to produce a film of the         precursor; and thereafter     -   annealing the film of the precursor to remove excess hydrazine         and hydrazinium chalcogenide salts to produce a metal         chalcogenide film on the substrate.

The present invention provides methods of preparing a film of metal chalcogenide semiconducting material that have the advantage of being low cost. The devices prepared according to the present invention that employ metal chalcogenide semiconducting materials prepared according to the present invention as the channel layer yield the highest mobilities currently reported for an n-type solution-processed device.

Additionally, the device characteristics are better behaved than those reported by Ridley et al. al. [B. A. Ridley et al., “All-Inorganic Field Effect Transistors Fabricated by Printing,” Science 286, 746-749 (1999)], in which CdSe semiconducting films are printed using a soluble metal chalcogenide precursor formed using organic derivatized CdSe nanocrystals.

The low-cost metal chalcogenide semiconducting materials produced according to the present invention can be used in a variety of applications, including flat panel displays, non-linear optical/photo-conductive devices, chemical sensors, emitting and charge transporting layers in light-emitting diodes, thin-film transistors, channel layers in field-effect transistors and media for optical data storage, including phase change media for optical data storage.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 depicts the Thermogravimetric Analysis (TGA) scan of the hydrazinium tin(IV) sulfide precursor.

FIG. 2 depicts the X-ray diffraction pattern of a tin(IV) sulfide film deposited by Method 1 using spin coating.

FIG. 3 depicts the X-ray crystal structure of (N₂H₄)₃(N₂H₅)₄Sn₂Se₆, including Sn₂Se₆ ⁴⁻ dimers alternating with hydrazinium cations and neutral hydrazine molecules.

FIG. 4 depicts the X-ray diffraction patterns of tin(IV) selenide precursor films deposited by Method 1 using spin coating.

FIG. 5 depicts the Thermogravimetric Analysis (TGA) scan of the ammonium tin(IV) sulfide precursor, (NH4)_(x)SnS_(y).

FIG. 6 depicts the X-ray diffraction patterns of tin(IV) sulfide precursor films deposited by Method 2 using spin coating.

FIG. 7 depicts X-ray diffraction patterns of antimony(III) sulfide precursor films deposited by Method 2 using spin coating.

FIG. 8 is a Schematic diagram of a TFT device structure employing a spin-coated metal chalcogenide semiconductor as the channel material.

FIG. 9 depicts plots of I_(D) and I_(D) ^(1/2) versus V_(G) at constant V_(D)=100 V for a TFT with a spin-coated SnS₂ channel fabricated using Method 1.

FIG. 10 depicts plots of Drain current, I_(D), versus source-drain voltage, V_(D), as a function of the gate voltage, V_(G), for a TFT with a spin-coated SnS₂ channel fabricated using Method 1.

FIG. 11 depicts plots of I_(D) and I_(D) ^(1/2) versus V_(G) at constant V_(D)=100 V for a TFT with a spin-coated SnS₂ channel fabricated using Method 2.

FIG. 12 depicts plots of drain current, I_(D), versus source-drain voltage, V_(D), as a function of the gate voltage, V_(G), for a TFT with a spin-coated SnS₂ channel fabricated using Method 2.

FIG. 13 depicts plots of I_(D) and I_(D) ^(1/2) versus V_(G) at constant V_(D)=100 V, for a TFT with a spin-coated SnSe_(2-x)S_(x) channel fabricated using Method 2.

FIG. 14 depicts plots of drain current, I_(D), versus source-drain voltage, V_(D), as a function of the gate voltage, V_(G), for a TFT with a spin-coated SnSe_(2-x)S_(x) channel fabricated using Method 2.

DETAILED DESCRIPTION OF THE INVENTION

The present invention provides a simple method (Method 1) of depositing thin films of metal chalcogenides involving the use of a hydrazine (or other hydrazine-like solvents)/chalcogenide mixture as solvent for metal chalcogenides or mixtures of metal chalcogenides. The film deposition of the hydrazinium-based precursor is carried out by standard solution-based techniques including spin coating, stamping, printing, or dip coating, using the above-mentioned solution. Thereafter, a short low-temperature anneal (typically, at a temperature less than about 350° C.) is carried out to remove excess hydrazine and hydrazinium chalcogenide salts from the sample and to improve the crystallinity of the resulting metal chalcogenide film.

Thus, the first method includes the steps of:

-   -   contacting: at least one metal chalcogenide; a hydrazine         compound represented by the formula:         R¹R²N—NR³R⁴         wherein each of R¹, R², R³ and R⁴ is independently hydrogen,         aryl, methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms; and optionally, an elemental chalcogen, such as,         S, Se, Te or a combination thereof; to produce a solution of a         hydrazinium-based precursor of the metal chalcogenide;     -   applying the solution of the hydrazinium-based precursor of the         metal chalcogenide onto a substrate to produce a film of the         precursor; and thereafter     -   annealing the film of the precursor to remove excess hydrazine         and hydrazinium chalcogenide salts to produce a metal         chalcogenide film on the substrate.

Preferably, in this method each of R¹, R², R³ and R⁴ is independently hydrogen, aryl, methyl or ethyl. More preferably, the hydrazine compound is hydrazine, i.e., where R¹, R², R³ and R⁴ are all hydrogens, methylhydrazine or 1,1-dimethylhydrazine.

The chalcogenide can further include an elemental chalcogen, such as, S, Se, Te or a combination thereof. The metal chalcogenide includes a metal, such as, Ge, Sn, Pb, Sb, Bi, Ga, In, Tl or a combination thereof and a chalcogen, such as, S, Se, Te or a combination thereof.

In one embodiment, the metal chalcogenide can be represented by the formula MX or MX₂ wherein M is a metal, such as, Ge, Sn, Pb or a combination thereof and wherein X is a chalcogen, such as, S, Se, Te or a combination thereof.

In another embodiment, the metal chalcogenide can be represented by the formula M₂X₃ wherein M is a metal, such as, Sb, Bi, Ga, In or a combination thereof and wherein X is a chalcogen, such as, S, Se, Te or a combination thereof.

In yet another embodiment, the metal chalcogenide can be represented by the formula M₂X wherein M is TI and wherein X is a chalcogen, such as, S, Se, Te or a combination thereof.

Preferably, the metal is Sn or Sb and the chalcogen is S or Se.

Examples of such chalcogenide systems include compounds represented by the formula: Sn(S_(2-x)Se_(x))

-   -   wherein x is from 0 to 2, including SnS₂ and SnSe₂.

Preferably, the metal chalcogenide film is in the form of a thin film and the thin film has a thickness of from about 5 Å to about 2,000 Å, more preferably from about 5 Å to about 1,000 Å.

The metal chalcogenide film can include a polycrystalline metal chalcogenide which has a grain size equal to or greater than the dimensions between contacts in a semiconductor device. However, the metal chalcogenide film can include single crystals of the metal chalcogenide.

The annealing step is carried out at a temperature and for a length of time sufficient to produce the metal chalcogenide film. Preferably, the temperature is from about 25° C. to about 500° C. More preferably, the temperature is from about 250° C. to about 350° C.

The substrate can be Kapton, silicon, amorphous hydrogenated silicon, silicon carbide (SiC), silicon dioxide (SiO₂), quartz, sapphire, glass, metal, diamond-like carbon, hydrogenated diamond-like carbon, gallium nitride, gallium arsenide, germanium, silicon-germanium, indium tin oxide, boron carbide, boron nitride, silicon nitride (Si₃N₄), alumina (Al₂O₃), cerium(IV) oxide (CeO₂), tin oxide (SnO₂), zinc titanate (ZnTiO₂), a plastic material or a combination thereof. The metal substrate is a metal foil, such as, aluminum foil, tin foil, stainless steel foil or gold foil and the plastic material is polycarbonate, Mylar or Kevlar.

The procedure for forming the solution for processing is carried out by adding hydrazine and chalcogenide to the desired metal chalcogenide and stirring. Unlike the methods of the prior art, no laborious steps are required to form nanoparticles with a narrow size distribution. Additionally, the small molecular species (i.e., hydrazine/hydrazinium) that are acting to make the metal chalcogenide component soluble, constitutes only a small weight percent of the sample (generally <40%), such that only a relatively small volume fraction of the sample is lost during the thermal treatment. This fact enables the deposition of thinner and higher quality films when compared with the earlier work by Dhingra et al., in which polychalcogenides and larger organic cations are employed (see S. Dhingra et al., “The use of soluble metal-polyselenide complexes as precursors to binary and ternary solid metal selenides,” Mat. Res. Soc. Symp. Proc., 180, 825-830 (1990)).

Using this technique, tertiary or higher order systems, such as, (SnS_(2-x)Se_(x)) can also be conveniently formed as thin films, enabling more detailed control over the band gap of the materials deposited. Thus, the present invention can be used most advantageously to form main-group metal (e.g., Ge, Sn, Pb, Sb, Bi, Ga, In, Tl) chalcogenide thin films.

Using the first technique described in the present invention (Method 1), a metal chalcogenide solution can be formed by adding hydrazine and a chalcogen (generally, S, Se or Te) to the metal chalcogenide being deposited.

While metal chalcogenides (MX₂) are generally not significantly soluble in many cases, the combined action of hydrazine and the elemental chalcogen vastly improves the solubility of the metal chalcogenides (MX₂). Further, the presence of an elemental chalcogen in small amounts improves film properties, such as, surface wetting, phase purity, grain growth and film structure.

A possible mechanism that may be operative in the above system is the following: N₂H₄+2X→N₂ (gas)+2H₂X  (1) 4N₂H₄+2H₂X+2MX₂→4N₂H₅ ⁺+M₂X₆ ⁴⁻ (in solution)  (2)

-   -   wherein M=a metal and X═S or Se.

As a first demonstration of the present invention, films of SnS₂ are deposited and characterized. In this case, the metal chalcogenide films can be deposited using spin coating, although they could equally be deposited using other solution-based techniques.

The present invention also provides a simple method (Method 2) of depositing thin films of metal chalcogenides involving: (1) the synthesis of a soluble ammonium-based precursor; (2) the use of hydrazine as a solvent for the precursor; (3) the deposition of a film using a standard solution-based technique (mentioned above) and (4) a low-temperature annealing step. The annealing step can be carried out at a temperature from about room temperature to about 500° C., but typically it is carried out at a temperature from about 250° C. to about 350° C.).

The second method according to the present invention is similar to the first process, except that a chalcogenide and an amine are first contacted to produce an ammonium-based precursor of the metal chalcogenide, which is then contacted with a hydrazine compound and and optionally, an elemental chalcogen. This method includes the steps of:

-   -   contacting: at least one metal chalcogenide and a salt of an         amine compound with H₂S, H₂Se or H₂Te, wherein said amine         compound is represented by the formula:         NR⁵R⁶R⁷         wherein each of R⁵, R⁶ and R⁷ is independently hydrogen, aryl,         methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms, to produce an ammonium-based precursor of the         metal chalcogenide;     -   contacting the ammonium-based precursor of the metal         chalcogenide, a hydrazine compound represented by the formula:         R¹R²N—NR³R⁴         wherein each of R¹, R², R³ and R⁴ is independently hydrogen,         aryl, methyl, ethyl or a linear, branched or cyclic alkyl of 3-6         carbon atoms, and optionally, an elemental chalcogen, such as,         S, Se, Te or a combination thereof, to produce a solution of a         hydrazinium-based precursor of the metal chalcogenide in the         hydrazine compound;     -   applying the solution of the hydrazinium-based precursor of the         metal chalcogenide onto a substrate to produce a film of the         precursor; and thereafter     -   annealing the film of the precursor to remove excess hydrazine         and hydrazinium chalcogenide salts to produce a metal         chalcogenide film on the substrate.

Preferably, each of R¹, R², R³, R⁴, R⁵, R⁶ and R⁷ can independently be hydrogen, aryl, methyl and ethyl. More preferably, R¹, R², R³, R⁴, R⁵, R⁶ and R⁷ are all hydrogens.

Preferably, the amine compound is NH₃, CH₃NH₂, CH₃CH₂NH₂, CH₃CH₂CH₂NH₂, (CH₃)₂CHNH₂, CH₃CH₂CH₂CH₂NH₂, phenethylamine, 2-fluorophenethylamine, 2-chlorophenethylamine, 2-bromophenethylamine, 3-fluorophenethylamine, 3-chlorophenethylamine, 3-bromophenethylamine, 4-fluorophenethylamine, 4-chlorophenethylamine, 4-bromophenethylamine, 2,3,4,5,6-pentafluorophenethylamine or a combination thereof.

The ammonium metal chalcogenide precursor can be prepared by a variety of techniques depending on the metal chalcogenide under consideration. Examples of such techniques include simple dissolution of the metal chalcogenide in an ammonium chalcogenide aqueous solution followed by evaporation of the solution, typically at room temperature, solvothermal techniques and by solid-state routes at elevated temperatures. In contrast to most metal chalcogenides, which are not substantially soluble in common solvents, the ammonium salts can be highly soluble in hydrazine with the vigorous evolution of ammonia and the formation of the hydrazinium salts of the metal chalcogenide [L. F. Audrieth et al., “The Chemistry of Hydrazine,” John Wiley & Sons, New York, 200 (1951)]. For example, the solubility of the ammonium-based SnS₂ precursor, exceeds 200 g/l in hydrazine.

Because the hydrazine moieties that solubilize the metal chalcogenide structure only weakly interact with the metal chalcogenide framework, they may be conveniently removed from the precursor film at low temperatures. Additionally, the starting materials are all chalcogenides (not halides or oxides), and therefore impurities of these elements, as well as carbon, are absent from the final films.

The present invention is distinct from the earlier disclosed use of hydrazine hydrate as a solvent for the precipitation of certain metal sulfides and selenides (e.g., zinc sulfide, copper selenide, silver-doped zinc sulfide, copper-doped zinc cadmium sulfide) [U.S. Pat. No. 6,379,585, assigned to Vecht et al., entitled “Preparation of Sulfides and Selenides”]. In the case of this previous work, the solvent (which always involves water, as well as hydrazine) generally enables the precipitation of a transition metal chalcogenide, rather than the dissolution of the metal chalcogenide for further solution-based processing.

The present techniques are not limited to the use of hydrazine, but it can also be used with hydrazine-like solvents such as 1,1-dimethylhydrazine and methylhydrazine or mixtures of hydrazine-like solvents with other solvents including, but not limited to, water, methanol, ethanol, acetonitrile and N,N-dimethylformamide.

Following film deposition, low-temperature heat treatment of the film, typically at less than about 350° C., yields a crystalline film of the desired metal chalcogenide, with the loss of hydrazine and hydrazinium chalcogenide (and decomposition products of these compounds).

The films prepared according to the present invention are of similar quality to those prepared directly from the metal chalcogenide, chalcogen and hydrazine. In both cases (either using the ammonium metal chalcogenide precursor or the metal chalcogenide plus chalcogen), the high degree of solubility in hydrazine is at least partially the result of the formation of the hydrazinium salt of the metal chalcogenide.

The films prepared by either method of the present invention can be removed from the substrate to produce an isolated film thereof.

Preferably, the substrate is fabricated from a material having at least one property selected from the following: thermally stable, i.e., stable up to about at least 300° C.; chemically inert towards the metal calcogenides; rigid; or flexible. Suitable examples include Kapton, silicon, amorphous hydrogenated silicon, silicon carbide (SiC), silicon dioxide (SiO₂), quartz, sapphire, glass, metal, diamond-like carbon, hydrogenated diamond-like carbon, gallium nitride, gallium arsenide, germanium, silicon-germanium, indium tin oxide, boron carbide, boron nitride, silicon nitride (Si₃N₄), alumina (Al₂O₃), cerium(IV) oxide (CeO₂), tin oxide (SnO₂), zinc titanate (ZnTiO₂), a plastic material or a combination thereof. Preferably, the metal substrate is a metal foil, such as, aluminum foil, tin foil, stainless steel foil and gold foil, and the plastic material preferably is polycarbonate, Mylar or Kevlar.

The processes described herein are useful in forming semiconductor films for applications including, for example, thin-film transistors (TFT's), light-emitting devices (LED's) and data storage media.

There are numerous examples of metal chalcogenide systems that are potentially useful as semiconductive materials. Tin(IV) sulfide, SnS₂, is one candidate that has generated substantial interest as a semiconducting material for solar cells, with n-type conductivity, an optical band gap of ˜2.1 eV and a reported mobility of 18 cm²N-sec [G. Domingo et al., “Fundamental Optical Absorption in SnS₂ and SnSe₂,” Phys. Rev. 143, 536-541 (1966)].

Such devices prepared according to the present invention yield the highest mobilities currently reported for an n-type solution-processed device. Additionally, the device characteristics are better behaved than those reported by Ridley et al. [B. A. Ridley et al., “All-inorganic Field Effect Transistors Fabricated by Printing,” Science 286, 746-749 (1999)], in which CdSe semiconducting films are printed using a soluble metal chalcogenide precursor formed using organic derivatized CdSe nanocrystals.

Accordingly, the present invention includes an improved field-effect transistor, based on a solution-processed chalcogenide channel layer using either Method 1 or Method 2 of the present invention.

The present invention provides a thin film field-effect transistor (FET) having a film of a metal chalcogenide semiconducting material as the active semiconductor layer. The present invention provides a method of preparing an improved field-effect transistor of the type having a source region and a drain region, a channel layer extending between the source region and the drain region, the channel layer including a semiconducting material, a gate region disposed in spaced adjacency to the channel layer, an electrically insulating layer between the gate region and the source region, drain region and channel layer, wherein the improvement includes:

-   -   preparing a channel layer including a film of a         solution-processed metal chalcogenide semiconducting material         using either Method 1 or Method 2 of the present invention.

In one embodiment, the source region, channel layer and drain region are preferably disposed upon a surface of a substrate, the electrically insulating layer is disposed over the channel layer and extending from the source region to the drain region, and the gate region is disposed over the electrically insulating layer, for example, as shown in FIG. 4 of U.S. Pat. No. 6,180,956, the contents of which are incorporated herein by reference.

In another embodiment, the gate region is disposed as a gate layer upon a surface of a substrate, the electrically insulating layer is disposed upon the gate layer, and the source region, channel layer, and drain region are disposed upon the electrically insulating layer, for example, as shown in FIG. 3 of the previously incorporated U.S. Pat. No. 6,180,956.

Preferably, the metal chalcogenide semiconducting material is in the form of a thin film, in which the metal chalcogenide semiconducting material is a polycrystalline material having a grain size equal to or greater than the dimensions between contacts in the semiconductor device. Accordingly, the present invention can provide an improved field-effect transistor prepared by the aforementioned method.

Referring to the Figures:

FIG. 1 depicts the Thermogravimetric Analysis (TGA) scan of the hydrazinium tin(IV) sulfide precursor, synthesized from SnS₂, S, and hydrazine, and run at 2° C./min to 800° C. in flowing nitrogen.

FIG. 2 depicts the X-ray diffraction pattern of a tin(IV) sulfide film deposited by Method 1 using spin coating and annealed at 300° C. for 10 min. The calculated c-axis parameter is 5.98 Å, consistent with the published bulk sample values for SnS₂, 5.90 Å [B. Palosz et al., J. Appl. Crystallogr. 22, 622 (1989)].

FIG. 3 depicts the X-ray crystal structure of (N₂H₄)₃(N₂H₅)₄Sn₂Se₆, including Sn₂Se₆ ⁴⁻ dimers alternating with hydrazinium cations and neutral hydrazine molecules.

FIG. 4 depicts the X-ray diffraction patterns of tin(IV) selenide precursor films deposited by Method 1 using spin coating and annealed at (a) 225° C., (b) 250° C., (c) 275° C., (d) 300° C. The films exhibit increasing crystallinity with increasing anneal temperature, as well as substantial c-axis preferred orientation. The calculated c-axis parameter using the 300° C. film is 6.13 Å, consistent with published bulk sample values for SnSe₂.

FIG. 5 depicts the Thermogravimetric Analysis (TGA) scan of the ammonium tin(IV) sulfide precursor, (NH₄)_(x)SnS_(y), run at 2° C./min to 800° C. in flowing nitrogen.

FIG. 6 depicts the X-ray diffraction patterns of tin(IV) sulfide precursor films deposited by Method 2 using spin coating and annealed at (a) unannealed, (b) 140° C., (c) 200° C., (d) 250° C., (e) 325° C., (f) 400° C. The films exhibit increasing crystallinity with increasing anneal temperature, as well as substantial c-axis preferred orientation. The calculated c-axis parameter using the 400° C. film is 5.95 Å, consistent with published bulk sample values for SnS₂, 5.90 Å [B. Palosz et al., J. Appl. Crystallogr. 22, 622 (1989)].

FIG. 7 depicts the X-ray diffraction patterns of antimony(III) sulfide precursor films deposited by Method 2 using spin coating and annealed at (a) 250° C. and (b) 325° C. The reflection indices, based on a published structure report for Sb₂S₃, are given in the figure [D. Nodland et al., North Dakota State University, Fargo, N. Dak., USA, ICDD Grant-in-Aid (1990)].

FIG. 8 is a Schematic diagram of a TFT device structure employing a spin-coated metal chalcogenide semiconductor as the channel material.

FIG. 9 depicts the Plots of I_(D) and I_(D) ^(1/2) versus V_(G) at constant V_(D)=100 V, used to calculate current modulation, I_(on)/I_(off), and saturation-regime field-effect mobility, μ, for a TFT with a spin-coated SnS₂ channel of length L=25 μm and width W=1500 μm, fabricated using Method 1. The gate dielectric is 3000μ SiO₂.

FIG. 10 depicts plots of Drain current, I_(D), versus source-drain voltage, V_(D), as a function of the gate voltage, V_(G), for a TFT with a spin-coated SnS₂ channel of length L=25 μm and width W=1500 μm, fabricated using Method 1. The gate dielectric is 3000 Å SiO₂.

FIG. 11 depicts plots of I_(D) and I_(D) ^(1/2) versus V_(G) at constant V_(D)=100 V, used to calculate current modulation, I_(on)/I_(off), and saturation-regime field-effect mobility, μ, for a TFT with a spin-coated SnS₂ channel of length L=25 μm and width W=1500 μm, fabricated using Method 2. The gate dielectric is 3000 Å SiO₂.

FIG. 12 depicts plots of drain current, I_(D), versus source-drain voltage, V_(D), as a function of the gate voltage, V_(G), for a TFT with a spin-coated SnS₂ channel of length L=25 μm and width W. =1500 μm, fabricated using Method 2. The gate dielectric is 3000 Å SiO₂.

FIG. 13 depicts plots of plots of I_(D) and I_(D) ^(1/2) versus V_(G) at constant V_(D)=100 V, used to calculate current modulation, I_(on)/I_(off), and saturation-regime field-effect mobility, μ, for a TFT with a spin-coated SnSe_(2-x)S_(x) channel of length L=25 μm and width W=1500 μm, fabricated using Method 2. The gate dielectric is 3000 Å SiO₂.

FIG. 14 depicts plots of drain current, I_(D), versus source-drain voltage, V_(D), as a function of the gate voltage, V_(G), for a TFT with a spin-coated SnSe_(2-x)S_(x) channel of length L=25 μm and width W=1500 μm, fabricated using Method 2. The gate dielectric is 3000 Å SiO₂.

Illustrative examples of the preparation of films of metal chalcogenide semiconducting materials and TFT devices thereof are provided below.

Method 1 EXAMPLE 1

A solution of SnS₂ was formed by dissolving 0.274 g SnS₂ (1.5 mmol) in 1.0 ml hydrazine and 0.048 g sulfur (1.5 mmol). Substantial bubbling is observed during the dissolution process, presumably as a result of evolution of primarily nitrogen during the reaction. The dissolution is somewhat slow at room temperature, requiring approximately 4-6 hours of stirring to produce a clear yellow solution. The solution was filtered and the filtrate was evaporated under a flow of nitrogen gas, ultimately yielding 0.337 g of yellow powder. Thermal analysis of the powder indicates that the resulting solid decomposes to form SnS₂ at a relatively low temperature, essentially by 200° C., with a weight loss of 38% observed during the process (FIG. 1).

A film of the above-described precursor can readily be deposited on a cleaned quartz substrate by dissolving 0.055 g SnS₂ (0.3 mmol) in 0.5 ml hydrazine and 0.010 g sulfur (0.3 mmol). Each substrate was precleaned sequentially in aqua regia, toluene, methanol and ultimately in a concentrated aqueous ammonium hydroxide solution. Thin films of SnS₂ are formed by depositing 3-4 drops of the above-mentioned SnS₂ solution onto the substrate, allowing the substrate/solution to sit for 20 min to improve the wetting, and spinning the substrate at 2000 rpm for 2 min in air. The resulting yellow films are annealed 300° C. for 10 minutes in an inert atmosphere. X-ray patterns for the resulting film are shown in FIG. 2 and indicate a crystalline film of SnS₂.

EXAMPLE 2

SnSe₂ films were also deposited using the above-described technique.

0.277 g SnSe₂ (1 mmol) was readily dissolved (in several minutes, with stirring) in 1 ml hydrazine when 0.079 g Se (1 mmol) have been added, yielding ultimately a light yellow solution. The light yellow coloration suggests the lack of formation of polychalcogenides during the process although if larger quantities of Se are added, a darker coloration of the solution is observed. Substantial bubbling is observed during the dissolution process, presumably as a result of evolution of primarily nitrogen during the reaction. Evaporating the solution under flowing nitrogen gas over the period of several hours leads to the formation of approximately 0.450 g of a yellow crystalline powder. The powder rapidly loses weight while sitting on a balance at room temperature, suggesting incorporation of solvent (i.e., hydrazine) within the structure, which slowly dissociates from the sample.

Single crystal structure refinement on a crystal collected from the product (FIG. 3) has composition (N₂H₄)₃(N₂H₅)₄Sn₂Se₆ and a structure including Sn₂Se₆ ⁴⁻ dimers alternating with hydrazinium cations and neutral hydrazine molecules. Note that the structure of the product supports the mechanism drawn out in equations (1) and (2).

Thin films of SnSe₂ are formed by depositing 3 drops of the above-mentioned SnSe₂ solution onto a substrate (e.g., quartz), allowing the substrate/solution to sit for 20 min to improve the wetting, and spinning the substrate at 2000 rpm for 2 min. The resulting yellow films are annealed at 225° C., 250° C., 275° C., and 300° C. for 10 minutes in an inert atmosphere. X-ray patterns for the resulting films are shown in FIG. 4, indicating increased crystallinity with increasing anneal temperature. However, even at the low temperatures (i.e., <<300° C.), crystalline films can be prepared. The X-ray diffraction pattern is in agreement with that for SnSe₂, and additionally indicates substantial preferred orientation.

Films of SnSe_(2-x)S_(x) (x≈1) have similarly been prepared starting with SnS₂, SnSe₂, S, Se and hydrazine, respectively.

Method 2

In accordance with the second method of the present invention for the preparation of a metal chalcogenide solution, an ammonium metal chalcogenide precursor can be prepared, depending on the metal chalcogenide under consideration, by any suitable technique including a simple dissolution of the metal chalcogenide in an ammonium chalcogenide aqueous solution followed by evaporation of the solution at room temperature, solvothermal techniques and by solid-state routes at elevated temperatures.

EXAMPLE 3

In this example, the ammonium-based tin(IV) sulfide precursor was synthesized by dissolving 548.5 mg of SnS₂ (3 mmol) in 85 ml of 50 wt. % aqueous ammonium sulfide, (NH₄)₂S, over a period of 4 days. The solution was filtered through a 0.45 μm glass microfiber filter and the resulting filtered solution was slowly evaporated under a flow of nitrogen gas over a period of several days, leading to a yellow product (˜1.05 g).

The product was repeatedly washed/filtered with methanol until the resulting filtrate was colorless and the thermal analysis scan on the final product yields a weight-loss transition at ˜150° C. (to yield SnS₂) of approximately 30% (FIG. 5). This indicates an approximate composition, (NH₄)₂SnS₃. The product is nominally amorphous, i.e., no X-ray pattern is observed in a powder diffractometer. The weight loss, which corresponds to loss of ammonia and hydrogen sulfide, is initiated at temperatures as low as ambient temperature, indicating the ease with which the material can be decomposed to SnS₂. Because the SnS₂ precursor need not have a fixed stoichiometric ratio, the precursor is referred to herein as (NH₄)_(x)SnS_(y).

The precursor, (NH₄)_(x)SnS_(y), was found to be highly soluble in hydrazine. For example, 80 mg of (NH₄)_(x)SnS_(y) can be easily dissolved in 0.5 ml anhydrous hydrazine, with vigorous evolution of ammonia. Accordingly, films can be conveniently spin-coated on quartz disks from the above mentioned hydrazine solution, either in an inert atmosphere drybox or in air, using approximately 3-4 drops of the precursor solution on each 0.75 inch quartz disk substrate and spinning at, for example, 2000 rpm for 2 minutes.

Each substrate was precleaned sequentially in aqua Reggie, toluene, methanol and ultimately in a concentrated aqueous ammonium hydroxide solution. The resulting film was light yellow in color (transparent) and very smooth in appearance.

Five annealing temperatures were considered: 140° C., 200° C., 250° C., 325° C., 400° C. For each temperature, the coated substrate was annealed at the prescribed temperature for 20 minutes on a temperature-controlled hot plate in an inert (nitrogen) atmosphere. X-ray studies of films indicate progressively improving crystallinity with increasing annealing temperature (FIG. 6), although some crystallinity is noted at temperatures even as low as 200° C.

EXAMPLE 4

As a second example of the ammonium-precursor technique, films of Sb₂S₃ were prepared.

The ammonium-based antimony(III) sulfide precursor was synthesized by dissolving 0.250 g of Sb₂S₃ (0.74 mmol) in 10 ml of 50 wt. % aqueous ammonium sulfide, (NH₄)₂S, over a period of several hours. The solution was filtered through a 0.45 μm glass microfiber filter and the resulting filtered solution was slowly evaporated under a flow of nitrogen gas over a period of 3 hours, leading to a darkly-colored product (˜0.385 g). The precursor, (NH₄)_(x)SbS_(y), was found to be highly soluble in hydrazine. For example, 80 mg of (NH₄)_(x)SnS_(y) can be easily dissolved in 0.5 ml anhydrous hydrazine, with vigorous evolution of ammonia. Films can therefore be conveniently spin-coated on quartz disks from the above mentioned hydrazine solution, either in an inert atmosphere dry box or in air, using approximately 3-4 drops of the precursor solution on each 0.75 inch quartz disk substrate and spinning, for example, at 2000 rpm for 2 minutes.

Each substrate was precleaned sequentially in aqua regia, toluene, methanol and ultimately in a concentrated aqueous ammonium hydroxide solution. The resulting film was lightly colored (transparent) and very smooth in appearance.

Two annealing temperatures were considered: 250° C. and 325° C. For each temperature, the coated substrate was annealed at the prescribed temperature for 20 minutes on a temperature-controlled hot plate in an inert (nitrogen) atmosphere. Upon placing the substrate on the hot plate, the color of the film immediately darkened, indicating the formation of Sb₂S₃. X-ray study of films indicates progressively improving crystallinity with increasing annealing temperature (FIG. 7).

Improved TFT Device EXAMPLE 5

TFT's were prepared, using the semiconducting metal chalcogenides described above as the semiconducting channel. For testing purposes, the devices tested include a heavily n-doped silicon substrate (which also acts as the gate), 3000 Å thermally grown SiO₂ insulating barrier layer, a spin-coated tin(IV) sulfide or selenide channel layer, and patterned 800 Å gold source and drain electrodes (FIG. 8).

For SnS₂ semiconducting channels, the spin-coating solution was prepared by either Method 1, i.e., dissolving 20 mg SnS₂ (0.11 mmol) in 1.6 ml hydrazine and 3.5 mg S (0.11 mmol), or Method 2, i.e., dissolving 25 mg of the ammonium precursor, (NH₄)_(x)SnS_(y), in 1.6 ml hydrazine. In either case, 3-4 drops of the tin(IV) sulfide solution are placed on cleaned 2 cm×2 cm silicon substrates (with the final cleaning step included of placing the substrates in ammonium hydroxide for at least ½ hr) and spun in air at 3500 rpm for 1 min. The annealing sequence for the Method 1 film includes a gradual ramp to 120° C., a dwell at 120° C. for 20 min, and finally an anneal at 300° C. for approximately 5 min. The film received a second anneal at 300° C. after deposition of the gold source and drain contacts, which substantially improved device characteristics.

The annealing sequence for the Method 2 film includes a gradual ramp to 120° C., a dwell at 120° C. for 20 min, and finally an anneal at 300° C. for approximately 15 min. Drain and gate sweep characteristics for the SnS₂ channels produced using Method 1 or 2 are shown in FIGS. 9-12.

The device characteristics for the devices made using Method 1 are μ_(sat)=0.20 cm²/V-sec, μ_(lin)=0.10 cm²N-sec, and I_(on)/I_(off)=7×10³, while for Method 2 the values are μ_(sat)=0.07 cm²N-sec, μ_(lin)=0.05 cm²N-sec, and I_(on)/I_(off)=6×10³.

EXAMPLE 6

Films of a mixed SnSe_(2-x)S_(x) type were also made using Method 2.

The ammonium precursor was synthesized by dissolving 0.360 g SnSe₂ (1.3 mmol) in 56 ml of 50 wt. % aqueous ammonium sulfide, (NH₄)₂S, over a period of several days. The solution was filtered through a 0.45 μm glass microfiber filter and the resulting filtered solution was slowly evaporated under a flow of nitrogen gas over a period of several days. The darkly-colored product was rinsed thoroughly with methanol, yielding 0.477 g of a darkly-colored product. The tin(IV) selenide/sulfide precursor layer was prepared by dissolving 30 mg of the precursor in 1.6 ml hydrazine and spinning 3-4 drops placed on the substrate at 3500 rpm for 1 min.

The oxide-coated silicon substrates were cleaned thoroughly and dipped in an ammonium hydroxide solution for at least an hour before spin coating of the metal chalcogenide solution. The annealing sequence for the films includes a gradual ramp to 120° C., a dwell at 120° C. for 20 min, and finally an anneal at 300° C. for approximately 15 min.

Device properties are shown in FIGS. 13 and 14, yielding μ_(sat)=1.3 cm²N-sec, μ_(lin)=1.0 cm²N-sec, and I_(on)/I_(off)=10³, some of the highest reported values for mobility for an n-type spin-coated semiconductor.

The present invention has been described with particular reference to the preferred embodiments. It should be understood that variations and modifications thereof can be devised by those skilled in the art without departing from the spirit and scope of the present invention. Accordingly, the present invention embraces all such alternatives, modifications and variations that fall within the scope of the appended claims. 

1. A first method of depositing a film of a metal chalcogenide, comprising the steps of: contacting: at least one metal chalcogenide; a hydrazine compound represented by the formula: R¹R²N—NR³R⁴ wherein each of R¹, R², R³ and R⁴ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms; and optionally, an elemental chalcogen selected from the group consisting of: S, Se, Te and a combination thereof; to produce a solution of a hydrazinium-based precursor of said metal chalcogenide; applying said solution of said hydrazinium-based precursor of said metal chalcogenide onto a substrate to produce a film of said precursor; and thereafter annealing said film of said precursor to remove excess hydrazine and hydrazinium chalcogenide salts to produce a metal chalcogenide film on said substrate.
 2. The method of claim 1, wherein said metal chalcogenide comprises a metal selected from the group consisting of: Ge, Sn, Pb, Sb, Bi, Ga, In, Tl and a combination thereof and a chalcogen selected from the group consisting of: S, Se, Te and a combination thereof.
 3. The method of claim 1, wherein said metal chalcogenide is represented by the formula MX or MX₂ wherein M is a metal selected from the group consisting of: Ge, Sn, Pb and a combination thereof; and wherein X is a chalcogen selected from the group consisting of: S, Se, Te and a combination thereof.
 4. The method of claim 1, wherein said metal chalcogenide is represented by the formula M₂X₃ wherein M is a metal selected from the group consisting of: Sb, Bi, Ga, In and a combination thereof; and wherein X is a chalcogen selected from the group consisting of: S, Se, Te and a combination thereof.
 5. The method of claim 1, wherein said metal chalcogenide is represented by the formula M₂X wherein M is Tl; and wherein X is a chalcogen selected from the group consisting of: S, Se, Te and a combination thereof.
 6. The method of claim 1, wherein said metal is selected from the group consisting of: Sn and Sb; and wherein said chalcogen is selected from the group consisting of: S and Se.
 7. The method of claim 6, wherein said chalcogenide is represented by the formula: Sn(S_(2-x)Se_(x)) wherein x is from 0 to
 2. 8. The method of claim 1, wherein each of R¹, R², R³ and R⁴ is independently selected from the group consisting of: hydrogen, aryl, methyl and ethyl.
 9. The method of claim 1, wherein R¹, R², R³ and R⁴ are hydrogen.
 10. The method of claim 1, wherein said metal chalcogenide film is in the form of a thin film.
 11. The method of claim 1, wherein said metal chalcogenide film comprises a polycrystalline metal chalcogenide or single crystals of said metal chalcogenide.
 12. The method of claim 11, wherein said polycrystalline metal chalcogenide has a grain size equal to or greater than the dimensions between contacts in a semiconductor device.
 13. The method of claim 1, wherein said annealing step is carried out at a temperature and for a length of time sufficient to produce said metal chalcogenide film.
 14. The method of claim 1, wherein said substrate is selected from the group consisting of: Kapton, silicon, amorphous hydrogenated silicon, silicon carbide (SiC), silicon dioxide (SiO₂), quartz, sapphire, glass, metal, diamond-like carbon, hydrogenated diamond-like carbon, gallium nitride, gallium arsenide, germanium, silicon-germanium, indium tin oxide, boron carbide, boron nitride, silicon nitride (Si₃N₄), alumina (Al₂O₃), cerium(IV) oxide (CeO₂), tin oxide (SnO₂), zinc titanate (ZnTiO₂), a plastic material and a combination thereof.
 15. A film prepared by the method of claim
 1. 16. A second method of depositing a film of a metal chalcogenide, comprising the steps of: contacting: at least one metal chalcogenide and a salt of an amine compound with H₂S, H₂Se or H₂Te, wherein said amine compound is represented by the formula: NR⁵R⁶R⁷ wherein each of R⁵, R⁶ and R⁷ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms, to produce an ammonium-based precursor of said metal chalcogenide; contacting said ammonium-based precursor of said metal chalcogenide, a hydrazine compound represented by the formula: R¹R²N—NR³R⁴ wherein each of R¹, R², R³ and R⁴ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms, and optionally, an elemental chalcogen selected from the group consisting of: S, Se, Te and a combination thereof; to produce a solution of a hydrazinium-based precursor of said metal chalcogenide in said hydrazine compound; applying said solution of said hydrazinium-based precursor of said metal chalcogenide onto a substrate to produce a film of said precursor; and thereafter annealing said film of said precursor to remove excess hydrazine and hydrazinium chalcogenide salts to produce a metal chalcogenide film on said substrate.
 17. The method of claim 16, wherein said metal chalcogenide comprises a metal selected from the group consisting of: Ge, Sn, Pb, Sb, Bi, Ga, In, Tl and a combination thereof and a chalcogen selected from the group consisting of: S, Se, Te and a combination thereof.
 18. The method of claim 16, wherein each of R¹, R², R³, R⁴, R⁵, R⁶ and R⁷ is independently selected from the group consisting of: hydrogen, aryl, methyl and ethyl.
 19. The method of claim 16, wherein R¹, R², R³, R⁴, R⁵, R⁶ and R⁷ are hydrogens.
 20. The method of claim 16, wherein said metal chalcogenide film is in the form of a thin film.
 21. The method of claim 16, wherein said metal chalcogenide film comprises a polycrystalline metal chalcogenide or single crystals of said metal chalcogenide.
 22. The method of claim 21, wherein said polycrystalline metal chalcogenide has a grain size equal to or greater than the dimensions between contacts in a semiconductor device.
 23. The method of claim 16, wherein said annealing step is carried out at a temperature and for a length of time sufficient to produce said metal chalcogenide film.
 24. The method of claim 16, wherein said substrate is selected from the group consisting of: Kapton, silicon, amorphous hydrogenated silicon, silicon carbide (SiC), silicon dioxide (SiO₂), quartz, sapphire, glass, metal, diamond-like carbon, hydrogenated diamond-like carbon, gallium nitride, gallium arsenide, germanium, silicon-germanium, indium tin oxide, boron carbide, boron nitride, silicon nitride (Si₃N₄), alumina (Al₂O₃), cerium(IV) oxide (CeO₂), tin oxide (SnO₂), zinc titanate (ZnTiO₂), a plastic material and a combination thereof.
 25. A film prepared by the method of claim
 16. 26. A method of preparing an improved field-effect transistor of the type having a source region and a drain region, a channel layer extending between the source region and the drain region, the channel layer including a semiconducting material, a gate region disposed in spaced adjacency to the channel layer, an electrically insulating layer between the gate region and the source region, drain region and channel layer, wherein the improvement comprises: preparing a channel layer comprising a film of a metal chalcogenide semiconducting material by a first or second method; wherein said first method comprises the steps of: contacting: at least one metal chalcogenide; a hydrazine compound represented by the formula: R¹R²N—NR³R⁴ wherein each of R¹, R², R³ and R⁴ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms; and optionally, an elemental chalcogen selected from the group consisting of: S, Se, Te and a combination thereof; to produce a solution of a hydrazinium-based precursor of said metal chalcogenide; applying said solution of said hydrazinium-based precursor of said metal chalcogenide onto a substrate to produce a film of said precursor; and thereafter annealing said film of said precursor to remove excess hydrazine and hydrazinium chalcogenide salts to produce a metal chalcogenide film; and wherein said second method comprises the steps of: contacting: at least one metal chalcogenide and a salt of an amine compound with H₂S, H₂Se or H₂Te, wherein said amine compound is represented by the formula: NR⁵R⁶R⁷ wherein each of R⁵, R⁶ and R⁷ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms, to produce an ammonium-based precursor of said metal chalcogenide; contacting said ammonium-based precursor of said metal chalcogenide, a hydrazine compound represented by the formula: R¹R²N—NR³R⁴ wherein each of R¹, R², R³ and R⁴ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms, and optionally, an elemental chalcogen selected from the group consisting of: S, Se, Te and a combination thereof, to produce a solution of a hydrazinium-based precursor of said metal chalcogenide in said hydrazine compound; applying said solution of said hydrazinium-based precursor of said metal chalcogenide onto a substrate to produce a film of said precursor; and thereafter annealing said film of said precursor to remove excess hydrazine and hydrazinium chalcogenide salts to produce a metal chalcogenide film on said substrate.
 27. The method of claim 26, wherein said source region, channel layer and drain region are disposed upon a surface of a substrate, said electrically insulating layer is disposed over said channel layer and extending from said source region to said drain region, and said gate region is disposed over said electrically insulating layer.
 28. The method of claim 26, wherein said gate region is disposed as a gate layer upon a surface of a substrate, said electrically insulating layer is disposed upon said gate layer, and said source region, channel layer, and drain region are disposed upon said electrically insulating layer.
 29. The method of claim 26, wherein said metal chalcogenide film is in the form of a thin film.
 30. The method of claim 29, wherein said thin film has a thickness of from about 5 Å to about 2,000 Å.
 31. The method of claim 26, wherein said metal chalcogenide film comprises a polycrystalline metal chalcogenide or single crystals of said metal chalcogenide.
 32. The method of claim 31, wherein said metal chalcogenide film is polycrystalline with a grain size equal to or greater than the dimensions between contacts in a semiconductor device.
 33. The method of claim 26, wherein said metal chalcogenide comprises a metal selected from the group consisting of: Ge, Sn, Pb, Sb, Bi, Ga, In, Tl and a combination thereof and a chalcogen selected from the group consisting of: S, Se, Te and a combination thereof.
 34. The method of claim 26, wherein each of R¹, R², R³, R⁴, R⁵, R⁶ and R⁷ is independently selected from the group consisting of: hydrogen, aryl, methyl and ethyl.
 35. The method of claim 34, wherein R¹, R², R³, R⁴, R⁵, R⁶ and R⁷ are hydrogens.
 36. The method of claim 26, wherein said annealing step is carried out at a temperature and for a length of time sufficient to produce said metal chalcogenide film.
 37. The method of claim 36, wherein said temperature is from about 25° C. to about 500° C.
 38. The method of claim 37, wherein said temperature is from about 250° C. to about 350° C.
 39. The method of claim 26, wherein said substrate is selected from the group consisting of: Kapton, silicon, amorphous hydrogenated silicon, silicon carbide (SiC), silicon dioxide (SiO₂), quartz, sapphire, glass, metal, diamond-like carbon, hydrogenated diamond-like carbon, gallium nitride, gallium arsenide, germanium, silicon-germanium, indium tin oxide, boron carbide, boron nitride, silicon nitride (Si₃N₄), alumina (Al₂O₃), cerium(IV) oxide (CeO₂), tin oxide (SnO₂), zinc titanate (ZnTiO₂), a plastic material and a combination thereof.
 40. An improved field-effect transistor prepared by the method of claim
 26. 41. A field-effect transistor comprising a channel layer having a metal chalcogenide film prepared by a method comprising steps of: contacting at least one metal chalcogenide and (i) a hydrazine compound or (ii) first an ammonium salt compound and thereafter a hydrazine compound, to produce a solution of a hydrazinium-based precursor of said metal chalcogenide; applying said solution of said hydrazinium-based precursor of said metal chalcogenide onto a substrate to produce a film of said precursor; and annealing said film of said precursor under conditions sufficient to produce said metal chalcogenide film.
 42. The method of claim 41, wherein said a hydrazine compound is represented by the formula: R¹R²N—NR³R⁴ wherein each of R¹, R², R³ and R⁴ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms.
 43. The method of claim 41, wherein said conditions sufficient to produce said metal chalcogenide film comprise a temperature from about 25° C. to about 500° C.
 44. A method of preparing a metal chalcogenide film in a field-effect transistor, comprising steps of: contacting at least one metal chalcogenide and (i) a hydrazine compound or (ii) first an ammonium salt compound and thereafter a hydrazine compound to produce a solution of a hydrazinium-based precursor of said metal chalcogenide; applying said solution of said hydrazinium-based precursor of said metal chalcogenide onto a substrate to produce a film of said precursor; and annealing said film of said precursor under conditions sufficient to produce said metal chalcogenide film.
 45. The method of claim 44, wherein said a hydrazine compound is represented by the formula: R¹R²N—NR³R⁴ wherein each of R¹, R², R³ and R⁴ is independently selected from the group consisting of: hydrogen, aryl, methyl, ethyl and a linear, branched or cyclic alkyl of 3-6 carbon atoms.
 46. The method of claim 44, wherein said conditions sufficient to produce said metal chalcogenide film comprise a temperature from about 25° C. to about 500° C. 